Hitachi FlexSEM 1000 II
The Hitachi FlexSEM 1000 II is a variable pressure scanning electron microscope. The FlexSEM-II is equipped with a secondary electron detector, a 5-segment back-scattered electron detector, and a ultra-variable-pressure detector for variable pressure SE imaging, which gives it the ability to image non-conductive surfaces, such as plastic and silicon substrates with submicron resolution.
Also included is an Oxford EDS system that makes it possible to perform simultaneous elemental analysis of surfaces.
For instrument training or assistance with sample preparation, please contact Microscopy and Analytical Imaging Lab personnel.
A Sputter Coater is available for preparing samples for imaging, if necessary.