Nanosurf FlexAFM
The Nanosurf FlexAFM atomic force microscope is configured for basic imaging and spectroscopy, as well as small-area lithography. The scan head has an XY range of 100 µm and a Z range of 10 µm. The sample stage has an XY range of 20 mm. Dry and liquid samples can be measured.
The following imaging modes are available:
- Dynamic Force
- Phase Contrast
- Static Force
- Force Modulation
- Spreading Resistance
- Lateral Force
The following spectroscopy modes are available:
- Force-Distance
- Amplitude-Distance
- Tip Current-Distance
- Voltage
The cantilever holder is configured for standard (1.6 x 3.4 x 0.3 mm) probe tips with alignment grooves.